Difference between revisions of "Redundancy"

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(added a few links to yet unwritten pages – removed todo note)
(added link to Physical debugging)
 
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== Related ==
 
== Related ==
  
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* [[Nanosystems]] page 419, 420, 421 – 14.3.3. Redundancy,reliability, and system lifetimes
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* [[Nanosystems]] page 420 – Figure 14.7. "Schematic diagram of a redundant, fault tolerant manufacturing archittecture. ..."
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* [[Routing system]], [[Routing level]], [[Routing layer]] – merging junctions and distribution junctions
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'''[[Reliability]]''': [[Nanosystems]] pages 16, 36, 159, 207
 
'''[[Reliability]]''': [[Nanosystems]] pages 16, 36, 159, 207
* [[Error rates]], [[Failure rates]], [[Damage]]
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* [[Error rates]], [[Failure rates]], [[Mechanisms of damage|Damage]]
 
* Redundacy: [[Nanosystems]] pages 159
 
* Redundacy: [[Nanosystems]] pages 159
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* [[Physical debugging]]
 
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* [[Radiation damage]]
 
* [[Radiation damage]]
 
* [[Self repair]]
 
* [[Self repair]]

Latest revision as of 13:34, 7 February 2022

This article is a stub. It needs to be expanded.
  • system redundancy
  • data redundancy
  • [todo: add links to Nanosystems sections ]
  • redundancy in building block routing
  • redundancy in convergent assembly

Related


Reliability: Nanosystems pages 16, 36, 159, 207