File:QPlus sensor with zoomin.jpg
Author: IMB Research
License: CC-BY-ND
Date: 2016-01-20
Higher resolution version (3200x1800) can be found here on flickr: https://www.flickr.com/photos/ibm_research_zurich/23874244373/in/photostream/ A related picture here: https://www.flickr.com/photos/ibm_research_zurich/23872861604/in/photostream/
Text from flickr:
Left: Model of a qPlus sensor [1]. On the quartz cantilever there are several electrodes applied to collect the strain-induced charges caused by the vertical deflection of the beam and to provide electrical contact to the conductive tip.
Right: Scanning electron microscope image of the cantilever end and the attached PtIr tip. The inset shows a close-up focused ion beam image of the tip apex with the IBM Smarter Planet icon engraved.
[1] Giessibl, F. J. High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Appl. Phys. Lett. 73, 3956–3958 (1998)
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| current | 15:42, 28 February 2024 | | 800 × 450 (70 KB) | Apm (Talk | contribs) | Author: IMB Research <br> License: CC-BY-ND <br> Date: 2016-01-20 <br> Higher resolution version (3200x1800) can be found here on flickr: https://www.flickr.com/photos/ibm_research_zurich/23874244373/in/photostream/ A related picture here: https://www... |
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