Difference between revisions of "Distorted visualization methods for convergent assembly"

From apm
Jump to: navigation, search
(added related section)
(improved nomenclature consistency usage and added more links in intro)
Line 1: Line 1:
 
{{stub}}
 
{{stub}}
To get a complete picture of all the [[convergent assembly]] levels of a nanofactory all in one image one needs to project space. <br>
+
To get a complete picture of the physical layout of all the [[assembly levels]] of the [[convergent assembly]] in a [[nanofactory]] (which might be organized in a stack of coplanar [[nanofactory layers|layers]]) and see all of this in one single image at one glance one needs to project space in a nonlinear way. <br>
 
Normal perspective (a linear projection) is unsuitable since it compresses most details towards the horizon.
 
Normal perspective (a linear projection) is unsuitable since it compresses most details towards the horizon.
 
Instead a nonlinear polar logarithmic mapping is the best fit.
 
Instead a nonlinear polar logarithmic mapping is the best fit.
  
An additional difficulty is that a nanofactory as opposed to a map is inherently three dimensional so some cross cut has to be choosen.
+
An additional difficulty is that a nanofactory as opposed to a map is inherently three dimensional so some cross cut has to be chosen. Whether that cross cut can be simply planar or not depends on the exact design choices taken in a concrete nanofactories design.
It depends on the nanofactories design whether that cross cut can be simply planar or not.
+
 
  
 
{{todo| add image [http://i.imgur.com/GFGJU.jpg] -- license?}}
 
{{todo| add image [http://i.imgur.com/GFGJU.jpg] -- license?}}
Line 14: Line 14:
 
* The software interface principle of '''progressive disclosure'''
 
* The software interface principle of '''progressive disclosure'''
 
* [[general software issues]]
 
* [[general software issues]]
 +
* [[assembly levels]]
 +
* [[nanofactory layers]]
  
 
== External Links ==
 
== External Links ==

Revision as of 15:24, 15 November 2016

This article is a stub. It needs to be expanded.

To get a complete picture of the physical layout of all the assembly levels of the convergent assembly in a nanofactory (which might be organized in a stack of coplanar layers) and see all of this in one single image at one glance one needs to project space in a nonlinear way.
Normal perspective (a linear projection) is unsuitable since it compresses most details towards the horizon. Instead a nonlinear polar logarithmic mapping is the best fit.

An additional difficulty is that a nanofactory as opposed to a map is inherently three dimensional so some cross cut has to be chosen. Whether that cross cut can be simply planar or not depends on the exact design choices taken in a concrete nanofactories design.


(TODO: add image [1] -- license?)

Related

External Links

  • python scripts to generate log-polar maps from pixelgraphics [2]
  • "Detail-In-Context Visualization for Satellite Imagery" [3]
    "Complex Logarithmic Views for Small Details in Large Contexts" [4]
    by Joachim Boettinger et. al.
    Department of Computer and Information Science, University of Konstanz, Germany
  • Video showing a manual multi-scale zoom device [5] the "zoom-scope"
  • square grid mapped to show details on all scales equally [6]
  • More large scale map examples [7]

Keywords

distortion lens view; log-polar map; complex logarithmic map, complex logarithmic view, anamorphic mirror, anamorphosis