Difference between revisions of "Scanning probe microscopy"
From apm
(Created page with " An atomically or near atomically sharp needle or crystal tip scans or swing-taps over a surface. Some physical interaction mechanism (electrical tunneling curren / force inte...") |
m (added link to Patterned layer epitaxy) |
||
| Line 6: | Line 6: | ||
* STM scanning tunnelling microscopy | * STM scanning tunnelling microscopy | ||
* AFM atomic force microscopy | * AFM atomic force microscopy | ||
| + | |||
| + | == Related == | ||
| + | |||
| + | * [[Patterned layer epitaxy]] | ||
== External Links == | == External Links == | ||
Revision as of 19:21, 17 November 2016
An atomically or near atomically sharp needle or crystal tip scans or swing-taps over a surface. Some physical interaction mechanism (electrical tunneling curren / force interaction / ...) is used for a feedback loop and as contrast source for the image. Images are usually scanned line by line slowly building up. Due to the local physical contact beside imaging actual manipulation can be done.
The two main types of SPM are:
- STM scanning tunnelling microscopy
- AFM atomic force microscopy
Related
External Links
- Wikipedia: scanning probe microscopy
- Wikipedia: scanning tunneling microscopy
- Wikipedia: atomic force microscopy
