Analytical methods: Difference between revisions
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* [https://en.wikipedia.org/wiki/Ellipsometry Ellipsometry] | * [https://en.wikipedia.org/wiki/Ellipsometry Ellipsometry] | ||
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* [https://en.wikipedia.org/wiki/List_of_materials_analysis_methods] | * [https://en.wikipedia.org/wiki/List_of_materials_analysis_methods List of materials analysis methods] | ||
=== (Mostly) bulk analytics === | === (Mostly) bulk analytics === | ||
Revision as of 11:10, 24 September 2026
Characterization dimensions for various methods
- what goes primary in & what goes primary out (light, free electrons, atoms, particles; current, voltage, …)
- gentleness vs destructiveness to the sample
- detection thresholds (e.g. for different elements)
- contrast mechanism(s)
- direction dependence of contrast (anisotropy)
- surface penetration depth
- qualitative vs quantitative if latter then methods-for and limits-on calibration (calibratability)
- requirements on ambient conditions (e.g. UHV needed? deep cryo needed?)
- locality: global average value or imaging if latter then what resolution
- real-space or k-space or something else needing computational pre-processing fro interpretability
- result interpretability in terms of concrete pysical quantities indirectly measured
External links
Surface analytics
- Scanning probe microscopy – And many "hyphenated" derived sub techniques.
- Scanning tunneling microscope
- Non-contact atomic force microscopy
(Mostly) bulk analytics
- (fluorescence) confocal laser scanning microscopy
- Förster resonance energy transfer
- Quenching (fluorescence)