Analytical methods: Difference between revisions

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* [https://en.wikipedia.org/wiki/Ellipsometry Ellipsometry]
* [https://en.wikipedia.org/wiki/Ellipsometry Ellipsometry]
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* [https://en.wikipedia.org/wiki/List_of_materials_analysis_methods]
* [https://en.wikipedia.org/wiki/List_of_materials_analysis_methods List of materials analysis methods]


=== (Mostly) bulk analytics ===
=== (Mostly) bulk analytics ===

Revision as of 11:10, 24 September 2026

This article is a stub. It needs to be expanded.

Characterization dimensions for various methods

  • what goes primary in & what goes primary out (light, free electrons, atoms, particles; current, voltage, …)
  • gentleness vs destructiveness to the sample
  • detection thresholds (e.g. for different elements)
  • contrast mechanism(s)
  • direction dependence of contrast (anisotropy)
  • surface penetration depth
  • qualitative vs quantitative if latter then methods-for and limits-on calibration (calibratability)
  • requirements on ambient conditions (e.g. UHV needed? deep cryo needed?)
  • locality: global average value or imaging if latter then what resolution
  • real-space or k-space or something else needing computational pre-processing fro interpretability
  • result interpretability in terms of concrete pysical quantities indirectly measured

External links

Surface analytics




(Mostly) bulk analytics



General