Redundancy: Difference between revisions
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== Related == | == Related == | ||
* [[Nanosystems]] page 419, 420, 421 – 14.3.3. Redundancy,reliability, and system lifetimes | |||
* [[Nanosystems]] page 420 – Figure 14.7. "Schematic diagram of a redundant, fault tolerant manufacturing archittecture. ..." | |||
* [[Routing system]], [[Routing level]], [[Routing layer]] – merging junctions and distribution junctions | |||
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'''[[Reliability]]''': [[Nanosystems]] pages 16, 36, 159, 207 | '''[[Reliability]]''': [[Nanosystems]] pages 16, 36, 159, 207 | ||
* [[Error rates]], [[Failure rates]], [[Mechanisms of damage|Damage]] | * [[Error rates]], [[Failure rates]], [[Mechanisms of damage|Damage]] | ||
* Redundacy: [[Nanosystems]] pages 159 | * Redundacy: [[Nanosystems]] pages 159 | ||
* [[Physical debugging]] | |||
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* [[Radiation damage]] | * [[Radiation damage]] | ||
* [[Self repair]] | * [[Self repair]] | ||
Latest revision as of 14:34, 7 February 2022
- system redundancy
- data redundancy
- [todo: add links to Nanosystems sections ]
- redundancy in building block routing
- redundancy in convergent assembly
Related
- Nanosystems page 419, 420, 421 – 14.3.3. Redundancy,reliability, and system lifetimes
- Nanosystems page 420 – Figure 14.7. "Schematic diagram of a redundant, fault tolerant manufacturing archittecture. ..."
- Routing system, Routing level, Routing layer – merging junctions and distribution junctions
Reliability: Nanosystems pages 16, 36, 159, 207
- Error rates, Failure rates, Damage
- Redundacy: Nanosystems pages 159
- Physical debugging