Apm: /* Indirect testing by analyzing the products */ added section == Additional thoughts ==

2022-02-07T13:30:19Z

Indirect testing by analyzing the products: added section == Additional thoughts ==

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 This is about checking if the outputted product meets expectations. <br>
 Obviously this works only for productive nanomachinery that produce and expel products.
 == Image based debugging ==

Apm: basic page

2022-02-07T13:06:51Z

basic page

New page

Of especial interest are methods that do not need any additional structures inside the nano-mechanical system beyond what is already there. 
Beyond that simple probing pins are a possibility.

== Range of motion testing ==

Deliberately moving through the range of motion of degrees of freedom
in order to test whether the constraints in motion match the expected behavior. 
Cases that may be encountered:
* Less range of motion than expected (something's blocked – "wrench in the gear" type failure)
* More range of motion than expected (something's broken off inside)
* There is an error but it does not change any rages of motion (thus undetectable via this test)

There may also be complex inter-dependencies between range of motion. 
E.g. in the case in non-Cartesian robotic designs with complex work envelope.

In such cases for more in depth testing one could go about theta by
Moving along and probing the borders of the expected 2D,3D or even higher dimensional work envelope.

''range of motion testing utilities''' may or may not be directly and permanently integrated in the nanomachinery.
For more complex testing it might be more suitable to do regular disassembly of the nanomachinery
and test it by reassembling it in a dedicated testing framework. 
See: [[Physical debugging]]

== Indirect testing by analyzing the products ==

This is about checking if the outputted product meets expectations. 
Obviously this works only for productive nanomachinery that produce and expel products.

== Image based debugging ==

Optical cameras can't work because of the way too large wavelength of for nanomachinery non ionizing light (soft UV).
Even sub-wavelength near field microscopy cant be used.
For high resolution surface only images gentle but high resolution [[matter wave microscopy]] might be the best bet.
But such microscopes will remain inherently macroscopic in size. So there's likely no way to screen all nanomachinery in question but rather a very tiny more or less random sample. See: [[Physical debugging]]

== Related ==

* '''[[Physical debugging]]'''
* [[Microcomponent maintenance microbot]]
* [[Redundancy]]
* [[Open loop control]]

Testing of gemstone based nanomachinery - Revision history

Apm: /* Indirect testing by analyzing the products */ added section == Additional thoughts ==

Apm: basic page