Physical debugging - Revision history

Apm: /* Visualisation with electron microscopy */ added link to Matter wave microscopy

2022-02-07T13:32:27Z

Visualisation with electron microscopy: added link to Matter wave microscopy

← Older revision		Revision as of 15:32, 7 February 2022
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	= High level "laboratory" analytics =		= High level "laboratory" analytics =

	== ~~Visualisation~~ with electron microscopy ==		== Visualization with electron microscopy ==

	Microcomponents could be stretched out in a single layer for imaging in an transmission electron microscope.		[[Microcomponents]] could be stretched out in a single layer for imaging in an transmission electron microscope.
	They are quite thick and may be rather heterogeneous inside though so one wouldn't see much.		They are quite thick and may be rather heterogeneous inside though so one wouldn't see much.
	Microcomponents may be designed to be further disassemblable - at this point it is ok if this is irreversible since the part is already broken.		Microcomponents may be designed to be further disassemblable - at this point it is ok if this is irreversible since the part is already broken.

			Related: [[Matter wave microscopy]]

	= Related =		= Related =

Apm: /* Related */ added link to Testing of gemstone based nanomachinery

2022-02-07T13:31:09Z

Related: added link to Testing of gemstone based nanomachinery

← Older revision		Revision as of 15:31, 7 February 2022
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	= Related =		= Related =

			* '''[[Testing of gemstone based nanomachinery]]'''
	* [[General software issues]]		* [[General software issues]]
	* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]		* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]

Apm: added link to new yet unwritten page * Testing of gemstone based nanomachinery

2022-02-07T12:35:46Z

added link to new yet unwritten page * Testing of gemstone based nanomachinery

← Older revision		Revision as of 14:35, 7 February 2022
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	* [[Microcomponent maintenance microbot]]s		* [[Microcomponent maintenance microbot]]s
	* [[Open loop control]]		* [[Open loop control]]
			* [[Testing of gemstone based nanomachinery]]

	[[Category:Information]]		[[Category:Information]]

Apm: /* Related / added back-link to: Open loop control

2021-08-24T06:21:28Z

Related: added back-link to: * Open loop control

← Older revision		Revision as of 08:21, 24 August 2021
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	* testing for functionality		* testing for functionality
	* [[Microcomponent maintenance microbot]]s		* [[Microcomponent maintenance microbot]]s
			* [[Open loop control]]

	[[Category:Information]]		[[Category:Information]]

Apm: fixed double redirect

2021-05-23T12:58:13Z

fixed double redirect

← Older revision		Revision as of 14:58, 23 May 2021
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	== Enrichment of damaged parts ==		== Enrichment of damaged parts ==

	If damage can be detected (e.g. suck movement, unresponsive, erronous responsive, ... ) with simple low level in place analytics one can "purify/enrich" the failing [[microcomponent]]s for either their disposal or their analysis. To do so one can take the whole product apart with a [[nanofactory]] or with a [[microcomponent recomposer device]] and possibly put it together again afterwards with the failed parts replaced. Alternatively [[microcomponent ~~maintainance units~~]] can be used to extract the damaged microcomponens in an in place [[self repairing system\|self repair]]ing system (hot swapping).		If damage can be detected (e.g. suck movement, unresponsive, erronous responsive, ... ) with simple low level in place analytics one can "purify/enrich" the failing [[microcomponent]]s for either their disposal or their analysis. To do so one can take the whole product apart with a [[nanofactory]] or with a [[microcomponent recomposer device]] and possibly put it together again afterwards with the failed parts replaced. Alternatively [[microcomponent maintenance microbot]]s can be used to extract the damaged microcomponens in an in place [[self repairing system\|self repair]]ing system (hot swapping).

	== Intermixed radiation damage ==		== Intermixed radiation damage ==
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	* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]		* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]
	* testing for functionality		* testing for functionality
	* [[Microcomponent maintenance ~~unit~~]]s		* [[Microcomponent maintenance microbot]]s

	[[Category:Information]]		[[Category:Information]]

Apm: /* Enrichment of damaged parts */ microcomponent recomposer => microcomponent recomposer device

2021-05-15T10:13:21Z

Enrichment of damaged parts: microcomponent recomposer => microcomponent recomposer device

← Older revision		Revision as of 12:13, 15 May 2021
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	== Enrichment of damaged parts ==		== Enrichment of damaged parts ==

	If damage can be detected (e.g. suck movement, unresponsive, erronous responsive, ... ) with simple low level in place analytics one can "purify/enrich" the failing [[microcomponent]]s for either their disposal or their analysis. To do so one can take the whole product apart with a [[nanofactory]] or with a [[microcomponent recomposer]] and possibly put it together again afterwards with the failed parts replaced. Alternatively [[microcomponent maintainance units]] can be used to extract the damaged microcomponens in an in place [[self repairing system\|self repair]]ing system (hot swapping).		If damage can be detected (e.g. suck movement, unresponsive, erronous responsive, ... ) with simple low level in place analytics one can "purify/enrich" the failing [[microcomponent]]s for either their disposal or their analysis. To do so one can take the whole product apart with a [[nanofactory]] or with a [[microcomponent recomposer device]] and possibly put it together again afterwards with the failed parts replaced. Alternatively [[microcomponent maintainance units]] can be used to extract the damaged microcomponens in an in place [[self repairing system\|self repair]]ing system (hot swapping).

	== Intermixed radiation damage ==		== Intermixed radiation damage ==

Apm: Category:Information

2017-07-16T06:09:34Z

Category:Information

← Older revision		Revision as of 08:09, 16 July 2017
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	* testing for functionality		* testing for functionality
	* [[Microcomponent maintenance unit]]s		* [[Microcomponent maintenance unit]]s

			[[Category:Information]]

Apm: /* Related */ link to testing and maintenance units

2015-09-28T12:39:03Z

Related: link to testing and maintenance units

← Older revision		Revision as of 14:39, 28 September 2015
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	* [[General software issues]]		* [[General software issues]]
	* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]		* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]
			* testing for functionality
			* [[Microcomponent maintenance unit]]s

Apm: /* Related */

2015-09-28T12:22:41Z

← Older revision		Revision as of 14:22, 28 September 2015
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	* [[General software issues]]		* [[General software issues]]
			* Cryo-electron tomography: [https://en.wikipedia.org/wiki/Cryo-electron_tomography (leave to wikipedia)]

Apm: Apm moved page Debugging to Physical debugging: "debugging" alone was too general

2015-09-22T11:09:49Z

Apm moved page Debugging to Physical debugging: "debugging" alone was too general

← Older revision	Revision as of 13:09, 22 September 2015
(No difference)