https://apm.bplaced.net/w/index.php?action=history&feed=atom&title=File%3AQPlus_sensor_with_zoomin.jpg 2026-04-20T18:42:54Z Revision history for this page on the wiki MediaWiki 1.43.0 https://apm.bplaced.net/w/index.php?title=File:QPlus_sensor_with_zoomin.jpg&diff=16181&oldid=prev 2024-02-28T13:42:08Z

<p>Author: IMB Research &lt;br&gt; License: CC-BY-ND &lt;br&gt; Date: 2016-01-20 &lt;br&gt; Higher resolution version (3200x1800) can be found here on flickr: https://www.flickr.com/photos/ibm_research_zurich/23874244373/in/photostream/ A related picture here: https://www...</p> <p><b>New page</b></p><div>Author: IMB Research &lt;br&gt;<br /> License: CC-BY-ND &lt;br&gt;<br /> Date: 2016-01-20 &lt;br&gt;<br /> <br /> Higher resolution version (3200x1800) can be found here on flickr:<br /> https://www.flickr.com/photos/ibm_research_zurich/23874244373/in/photostream/<br /> A related picture here:<br /> https://www.flickr.com/photos/ibm_research_zurich/23872861604/in/photostream/<br /> <br /> &#039;&#039;&#039;Text from flickr:&#039;&#039;&#039; &lt;br&gt;<br /> <br /> Left: Model of a qPlus sensor [1]. On the quartz cantilever there are several electrodes applied to collect the strain-induced charges caused by the vertical deflection of the beam and to provide electrical contact to the conductive tip.<br /> <br /> Right: Scanning electron microscope image of the cantilever end and the attached PtIr tip. The inset shows a close-up focused ion beam image of the tip apex with the IBM Smarter Planet icon engraved.<br /> <br /> [1] Giessibl, F. J. High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Appl. Phys. Lett. 73, 3956–3958 (1998)</div>

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